Defect Detection

GP Solar in-house developments in camera optics enable spectral defect analysis for process control of innovative solar cell concepts (Image: GP Solar)

This improvement greatly facilitates measurements required for innovative processes such as those used for manufacturing selective emitters and back-side contacts. A new software development simplifies the set-up of new recipes, allows individual fine tuning of the print set-up, and enables defect analysis of up to 600 samples, making minute process problems visible. Now, the software is also available with a Chinese user interface.

The GP TOPO-D .Scan inline inspection device for full-surface 3D topographic measuring of wafers and solar cells permits measurement within a second without stopping the production process. The height resolution of the measurement is 4 µm at a lateral resolution of 160 µm on standard belt conveyor systems. The system detects saw marks on wafers as well as three-dimensional print defects on solar cell rear sides. The GP TF-SENSE .Scan is a high-quality inspection system for 100 percent inspection of thin film modules. Due to advanced sampling automation each individual substrate can be measured without affecting the production cycle. The integrated Fischerscope XRF sensor is optimized for continuous material analysis and ensures a customized detection of CIGS layers. The inspection systems can be readily and rapidly integrated into production lines.  www.gpsolar.de