X-ray Fluorescence Inspection
Inline Quality Control
The efficiency of a thin-film solar module is largely dependent upon the composition and homogeneity of the layer of metal applied. X-ray fluorescence provides an excellent means of monitoring these two characteristics in a production environment.
Incorporating an ELBRUS.COMPACT.DUO measuring head from IFG GmbH, the fully automated Manz IQ-XRF system is suitable for mass-production applications. It is available for a variety of different substrate sizes and can be integrated into existing production lines to provide the continuous accurate quality control necessary for module manufacturers to ensure that they actually deliver products with the promised level of efficiency.
The measuring head used in the system enables highly accurate and extremely fast measurements. It can be moved extremely precisely along one axis in order to measure different areas of the substrate. Access to every point of the substrate is provided by moving it perpendicular to the head. A flexible loading and unloading system facilitates integration into both existing and newly planned production lines. The self-calibrating measuring head can be positioned above the area to be inspected with an accuracy of less than one millimeter. The results of measurements needed to optimize coating system parameters are displayed on the company’s Aico View Display human-machine interface. The unit can be interfaced to the coating system as well as to an overarching MES system. A modified version of the XRF system is also available as a free-standing/independent unit.